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Time Domain Reflection (TDR) Impedance Test by VNA
Release time :2022.03.14 Reading quantity:1300

With the rapid development of the information industry, the demand for network bandwidth is also increasing, which requires information equipment (such as large servers, computers and switches) to be able to carry increasingly faster data rates. Information equipment manufacturers are also paying more attention to signal integrity issues in high-speed interconnect channels, and TDR differential impedance is one of the important test items.

 

The advanced time domain analysis option of S3604 series vector network analyzer provides virtual eye pattern and analysis function based on S parameter. The output unit of the simulation code type is used to generate the data bits of 0 and 1 change, convolve the simulation code type with the time-domain impulse response of the tested part, and obtain the virtual eye map after superposition. Depending on the different high speed digital communication standards, TDR options can be used for high efficiency Pass/Fail tests using predefined eye pattern templates.

 

The advanced time domain analysis option can apply Jitter, noise and other interference on the simulation eye pattern, and simulate the simulation eye pattern at different positions of high-speed link in real environment by adding correction algorithms such as pre-weighting and equalization.

 

 

The Vector Network Analyzer Advanced Time Domain Analysis option provides the following features:

♦   Wide frequency coverage with a four-port option to make testing of the latest high-speed data standards possible

♦   Large dynamic range for testing the real performance of DUTs

♦   Excellent noise background ensures accurate and repeatable testing

♦   Fast measurement speed for real-time analysis of DUT characteristics

♦   Advanced calibration technology reduces measurement errors

♦   Automatic fixture removal technology ensures easy removal of fixture and probe effects on test results

♦   Accurate TDR/TDT and S-parameter data of the measured parts can be obtained simultaneously

♦   Simultaneous time and frequency domain analysis to help find the source of loss, reflection and crosstalk

♦   Single connection for forward and reverse transmission and reflection measurements

♦   Provides test results for all transmission modes (single-ended, differential and mode switching)

♦   Evaluation of transmission performance of high-speed interconnects through simulated eye diagrams

♦   Provide simulation code generator to get PRBS, K28.5 and ABS code pattern, and support user definition

♦   Built-in predefined high-speed serial standard eye diagram templates

♦   No pulse generator required, eye diagram generated based on frequency domain data

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