STE110 series Semiconductor C-V Characteristic Analyzer adopts an integrated design, diode, transistor, MOS tube and IGBT semiconductor power devices such as parasitic capacitance, CV characteristics can be tested with one key, without frequent switching wiring and setting parameters, single tube power devices and module power devices can be quickly tested with one key, suitable for rapid production line testing, automatic integration.
CV curve scanning analysis capability can also meet the laboratory research and development of semiconductor materials and power devices and analysis.
The design frequency of the instrument is 1kHz-2MHz, the VGS voltage is up to ±40V, and the VDS voltage is up to ±200V/±1500V/±3000V, which is sufficient to meet most power device tests.
** Standard Lead Time: within 4 weeks **